Journal article
High resolution mapping of strains and rotations using electron backscatter diffraction
- Abstract:
-
The angular resolution of electron backscatter diffraction (EBSD) measurements can be significantly improved using an analysis based on determination of small shifts in features from one pattern to the next using cross-correlation functions. Using pattern shift measurements at many regions of the pattern, errors in the best fit strain and rotation tensors can be reduced. The authors show that elements of the strain tensor and small misorientations can be measu...
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- Publication status:
- Published
- Peer review status:
- Peer reviewed
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Authors
Bibliographic Details
- Publisher:
- Taylor and Francis Publisher's website
- Journal:
- Materials Science and Technology Journal website
- Volume:
- 22
- Issue:
- 11
- Pages:
- 1271-1278
- Publication date:
- 2013-07-19
- Acceptance date:
- 2006-03-23
- DOI:
- EISSN:
-
1743-2847
- ISSN:
-
0267-0836
Item Description
Terms of use
- Copyright holder:
- Institute of Materials, Minerals and Mining
- Copyright date:
- 2013
- Notes:
- © 2006 Institute of Materials, Minerals and Mining Published by Maney on behalf of the Institute. This is the accepted manuscript version of the article. The final version is available online from Taylor & Francis at: https://doi.org/10.1179/174328406X130966
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