Journal article
Sub-angstrom characterization of structural origin for high in-plane anisotropy in 2D GeS2
- Abstract:
-
Materials with layered crystal structures and high in-plane anisotropy, such as black phosphorus, present unique properties and thus promise for applications in electronic and photonic devices. Recently, the layered structures of GeS2 and GeSe2 were utilized for high-performance polarization-sensitive photodetection in the short wavelength region due to their high in-plane optical anisotropy and wide band gap. The highly complex, low-symmetric (monoclinic) crystal structures are at the origin...
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- Publication status:
- Published
- Peer review status:
- Peer reviewed
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Authors
Bibliographic Details
- Publisher:
- American Chemical Society Publisher's website
- Journal:
- ACS Nano Journal website
- Volume:
- 14
- Issue:
- 4
- Pages:
- 4456–4462
- Publication date:
- 2020-04-10
- Acceptance date:
- 2020-04-10
- DOI:
- EISSN:
-
1936-086X
- ISSN:
-
1936-0851
Item Description
- Language:
- English
- Keywords:
- Pubs id:
-
1099884
- Local pid:
- pubs:1099884
- Deposit date:
- 2020-04-13
Terms of use
- Copyright holder:
- American Chemical Society
- Copyright date:
- 2020
- Rights statement:
- Copyright © 2020 American Chemical Society
- Notes:
- This is the accepted manuscript version of the article. The final version is available online from American Chemical Society at https://doi.org/10.1021/acsnano.9b10057
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