Segregation-assisted plasticity in Ni-based superalloys
Correlative high resolution transmission electron microscopy and energydispersive X-ray spectroscopy are used to study deformation-induced planar faults in the single crystal superalloy MD2 crept at 800 ◦C and 650 MPa. Segregation of Cr and Co at microtwins, anti-phase boundaries (APB) and complex/superlattice extrinsic and intrinsic stacking faults (CESF/SESF and CISF/SISF) is confirmed and quantified. The extent of this is found to depend upon the fault type, being most pronounced for the A...Expand abstract
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