Thesis
Microstructural characterisation of novel nitride nanostructures using electron microscopy
- Abstract:
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Novel semiconductor nanostructures possess a range of notable properties that have the potential to be harnessed in the next generation of optical devices. Electron microscopy is uniquely suited to characterising the complex microstructure, the results of which may be related to the growth conditions and optical properties. This thesis investigates three such novel materials: (1) GaN/InGaN core/shell nanowires, (2) n-GaN/InGaN/p-GaN core/multi-shell microrods and (3) Zn3N2<...>
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Funding
+ Engineering and Physical Sciences Research Council
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Funding agency for:
Severs, J
Bibliographic Details
- Publication date:
- 2014
- Type of award:
- DPhil
- Level of award:
- Doctoral
- Awarding institution:
- Oxford University, UK
Item Description
- Language:
- English
- Keywords:
- Subjects:
- UUID:
-
uuid:6229b51e-70e7-4431-985e-6bcb63bd99d1
- Local pid:
- ora:11685
- Deposit date:
- 2015-06-19
Terms of use
- Copyright holder:
- Severs, J
- Copyright date:
- 2014
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