Conference item
A convenient method for X-ray analysis in TEM that measures mass thickness and composition
- Abstract:
-
We consider a new approach for quantitative analysis in transmission electron microscopy (TEM) that offers the same convenience as single-standard quantitative analysis in scanning electron microscopy (SEM). Instead of a bulk standard, a thin film with known mass thickness is used as a reference. The procedure involves recording an X-ray spectrum from the reference film for each session of acquisitions on real specimens. There is no need to measure the beam current; the current only needs to ...
Expand abstract
- Publication status:
- Published
- Peer review status:
- Peer reviewed
Actions
Access Document
- Files:
-
-
(Version of record, pdf, 1.8MB)
-
- Publisher copy:
- 10.1088/1757-899x/304/1/012017
Why is the content I wish to access not available via ORA?
Bibliographic data (the information relating to research outputs) and full-text items (e.g. articles, theses, reports, etc.) arrive in ORA from several different sources. Unfortunately we are not able to make available the full-text for every research output.
Please contact the ORA team (
) if you have queries regarding unavailable content OR if you are aware of a full-text copy we can make available.
) if you have queries regarding unavailable content OR if you are aware of a full-text copy we can make available.
Content may be unavailable for the following four reasons
-
Version unsuitable
-
We have not obtained a suitable full-text for a given research output. See this page for more information.
-
Recently completed
-
Sometimes content is held in ORA but is unavailable for a fixed period of time to comply with the policies and wishes of rights holders.
-
Permissions
-
All content made available in ORA should comply with relevant rights, such as copyright. See this page for more information.
-
Clearance
-
Some thesis volumes scanned as part of the digitisation scheme funded by Dr Leonard Polonsky are currently unavailable due to sensitive material or uncleared third-party copyright content. We are attempting to contact authors whose theses are affected.
Alternative access to the full-text
You may be able to access the full-text directly from the publisher's website using the 'Publisher Copy' link in the 'Links & Downloads' box from a research output's ORA record page. This method may require an institutional or individual subscription to the journal/resource.
Authors
Bibliographic Details
- Publisher:
- IOP Publishing Publisher's website
- Journal:
- IOP Conference Series: Materials Science and Engineering Journal website
- Volume:
- 304
- Issue:
- 1
- Article number:
- 012017
- Host title:
- IOP Conference Series: Materials Science and Engineering
- Publication date:
- 2018-01-25
- Acceptance date:
- 2018-01-12
- DOI:
- EISSN:
-
1757-899X
- ISSN:
-
1757-8981
- Source identifiers:
-
827504
Item Description
- Keywords:
- Pubs id:
-
pubs:827504
- UUID:
-
uuid:4650c732-996a-407b-8540-12ddfc4af24f
- Local pid:
- pubs:827504
- Deposit date:
- 2019-06-17
Terms of use
- Copyright holder:
- Statham et al
- Copyright date:
- 2018
- Notes:
- © P Statham et al 2018. Published under licence by IOP Publishing Ltd. Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. This paper was presented at the 15th European Workshop on Modern Developments and Applications in Microbeam Analysis and IUMAS-7 Meeting - 7th Meeting of the International union of Microbeam Analysis Societies, 7–11 May 2017, Konstanz, Germany.
- Licence:
- CC Attribution (CC BY)
If you are the owner of this record, you can report an update to it here: Report update to this record